Electron microscopes are inherently sensitive to vibration disturbances transmitted through solid structures.
Passive vibration isolation tables, which have structural resonance zones, can critically compromise the performance of high-resolution electron microscopes by amplifying these disturbances.

VAIS-PB is an active vibration isolation table specifically optimized for electron microscopes, designed to eliminate vibration amplification caused by resonance.

Incorporating a pneumatic support frame with excellent damping characteristics, VAIS-PB ensures stable vibration isolation even under impact vibrations, outperforming competitor models that rely on metal spring support systems.

Since its successful commercialization in 2014—the first of its kind in Korea—VAIS-PB has been widely adopted by major electron microscope manufacturers both domestically and internationally, proving its superior performance.

The pneumatic support frame provides superior resistance to harsh impact vibrations compared to competitor models using metal spring support systems.

Combines feedback and feedforward control technologies to effectively isolate vibrations below 10 Hz..

Front LED indicators allow quick and clear assessment of ambient vibration levels and system status.

Equipped with height sensors, the system automatically maintains a level position even when the load has an uneven center of gravity.

Allows remote adjustment of control parameters and system diagnostics without requiring an engineer's visit.

※ Custom specifications available upon request.