VAIS-AMT Hero Image

VAIS-AMT

Table top
active anti-vibration system

Table top active isolator (VAIS-AMT)

VAIS-AMT is Korea's first commercially successful active vibration isolation table in 2007. Developed specifically for nano-precision instruments vulnerable to vibration disturbances, such as Atomic Force Microscopes.

VAIS-AMT delivers isolation performance compliant with the international ultra-low vibration standard, IEST VC-G Class. Its performance has been verified by leading manufacturers of nano-precision instruments, ensuring proven reliability.

Designed to effectively eliminate structural resonance and operate without compressed air, it offers both ease of installation and high stability.

Providing superior performance and cost-efficiency compared to passive systems, VAIS-AMT is an optimal and economical solution for demanding precision environments.

Specifications

1. Easy Installation and Mobility

Utilizes metal spring support, enabling easy setup and relocation anywhere with simple power connection—no compressed air required.

2. Superior Low-Frequency Vibration Isolation

Combines feedback and feedforward control technologies to effectively isolate vibrations below 10 Hz.

3. Intuitive Status Monitoring

Front LED indicators allow quick and clear assessment of ambient vibration levels and system status.

4. Simple On-site Troubleshooting

Digital control system enables users to resolve minor issues directly on-site without technical assistance.

5. Remote Control Support

Allows remote adjustment of control parameters and system diagnostics without requiring an engineer's visit.

Model AMT-045 AMT-056
Dimension [mm] 396(W) X 496(L) X 110(H) [mm] 496(W) X 596(L) X 110(H) [mm]
self-weight [kg] 23 [kg] 37 [kg]
Loadable
weight [kg]
0 ~ 60 [kg] 0 ~ 150 [kg]
Model AMT-067 AMT-078
Dimension [mm] 596(W) X 696(L) X 120(H) [mm] 696(W) X 796(L) X 120(H) [mm]
self-weight [kg] 56 [kg] 85 [kg]
Loadable
weight [kg]
0 ~ 200 [kg] 0 ~ 300 [kg]

※ Custom specifications available upon request.

Drawings

Applications (Click to enlarge)

Scanning Probe Microscopy
Application 1

BRUKER / Multimode8

Application 2

BRUKER / Innova-SPM

Application 3

BRUKER / BioAFM

Application 4

BRUKER / Dimension Icon

Application 5

Oxford-Witec / Alpha 300

Application 6

Oxford / Cypher

Electron Microscopy
Application 9

Thermo Fisher / Phenom ProX

Application 10

Thermo Fisher / Phenom XL

Application 11

Thermo Fisher / Phenom Pharos

Application 12

COXEM / EM30 series

Application 13

COXEM / EM CX series

Optical Metrology / Nano Property
Application 14

Olympus / OLS 5100

Application 15

Olympus / OLS 4100

Application 16

Olympus / OLS 5100 LAF

Application 17

Olympus Inverted Microscope

Application 18

Nanosystem NV series

Application 19

Zeiss / Digital Microscope

Application 20

Keyence / 3D measurement

Application 21

Keyence / Laser Microscope

Application 22

Interferometer

Application 23

KLA / Nano Indentation

Application 24

Probe station