Electron microscopes are inherently sensitive to vibration disturbances transmitted through solid structures.
Passive vibration isolation tables, which have structural resonance zones, can critically compromise the performance of high-resolution electron microscopes by amplifying these disturbances.

VAIS-PB is an active vibration isolation table specifically optimized for electron microscopes and designed to eliminate vibration amplification caused by resonance.

Incorporating a pneumatic support frame with excellent damping characteristics, VAIS-PB ensures stable vibration isolation even under impact-induced vibration, outperforming competitor models that rely on metal spring support systems.

Since its successful commercialization in 2014—the first of its kind in Korea—VAIS-PB has been widely adopted by major electron microscope manufacturers both domestically and internationally, proving its superior performance.